慶應義塾

研究発表

多田 宗弘

101~110件(全110件)
2018.10

High-density and fault-tolerant Cu atom switch technology toward 28nm-node nonvolatile programmable logic

講演者
Nebashi, R. and Banno, N. and Miyamura, M. and Tsuji, Y. and Morioka, A. and Bai, X. and Okamoto, K. and Iguchi, N. and Numata, H. and Hada, H. and Sugibayashi, T. and Sakamoto, T. and Tada, M.
会議名
会議名Digest of Technical Papers - Symposium on VLSI Technology 開催年月日2018 - 2018
2009

Highly scalable nonvolatile TiOx/TaSiOy solid-electrolyte crossbar switch integrated in local interconnect for low power reconfigurable logic

講演者
Tada, M. and Sakamoto, T. and Tsuji, Y. and Banno, N. and Saito, Y. and Yabe, Y. and Ishida, S. and Terai, M. and Kotsuji, S. and Iguchi, N. and Aono, M. and Hada, H. and Kasai, N.
会議名
会議名Technical Digest - International Electron Devices Meeting, IEDM 開催年月日2009 - 2009
2012

Improved off-state reliability of nonvolatile resistive switch with low programming voltage

講演者
Tada, M. and Sakamoto, T. and Miyamura, M. and Banno, N. and Okamoto, K. and Iguchi, N. and Hada, H.
会議名
会議名IEEE Transactions on Electron Devices 開催年月日2012.09 - 2012.09
主催
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
記述原語
英語
2012

Improved reliability and switching performance of atom switch by using ternary Cu-alloy and RuTa electrodes

講演者
Tada, M. and Sakamoto, T. and Banno, N. and Okamoto, K. and Miyamura, M. and Iguchi, N. and Hada, H.
会議名
会議名Technical Digest - International Electron Devices Meeting, IEDM 開催年月日2012 - 2012
2003

Improvement of TDDB reliability in Cu damascene interconnect by using united hard-mask and Cap (UHC) structure

講演者
Tada, M. and Harada, Y. and Ohtake, H. and Saito, S. and Onodera, T. and Hayashi, Y.
会議名
会議名Proceedings of the IEEE 2003 International Interconnect Technology Conference, IITC 2003 開催年月日2003 - 2003
2009

Nonvolatile solid-electrolyte switch embedded into Cu interconnect

講演者
Sakamoto, T. and Tada, M. and Banno, N. and Tsuji, Y. and Saitoh, Y. and Yabe, Y. and Hada, H. and Iguchi, N. and Aono, M.
会議名
会議名Digest of Technical Papers - Symposium on VLSI Technology 開催年月日2009 - 2009
2004

Novel molecular-structure design for PECVD porous SiOCH films toward 45nm-node, ASICs with k=2.3

講演者
Hayashi, Y. and Itoh, F. and Harada, Y. and Takeuchi, T. and Tada, M. and Tagami, M. and Ohtake, H. and Hijioka, K. and Saito, S. and Onodera, T. and Hara, D. and Tokudome, K.
会議名
会議名Proceedings of the IEEE 2004 International Interconnect Technology Conference 開催年月日2004 - 2004
2016

Novel processor architecture for onboard infrared sensors

講演者
Hihara, H. and Iwasaki, A. and Tamagawa, N. and Kuribayashi, M. and Hashimoto, M. and Mitsuyama, Y. and Ochi, H. and Onodera, H. and Kanbara, H. and Wakabayashi, K. and Tada, M.
会議名
会議名Proceedings of SPIE - The International Society for Optical Engineering 開催年月日2016 - 2016
主催
SPIE-INT SOC OPTICAL ENGINEERING
記述原語
英語
2010

Polymer Solid-Electrolyte (PSE) switch embedded in 90nm CMOS with forming-free and 10nsec programming for low power, Nonvolatile Programmable Logic (NPL)

講演者
Tada, M. and Sakamoto, T. and Okamoto, K. and Miyamura, M. and Banno, N. and Katoh, Y. and Ishida, S. and Iguchi, N. and Sakimura, N. and Hada, H.
会議名
会議名Technical Digest - International Electron Devices Meeting, IEDM 開催年月日2010 - 2010
2020

1.5x Energy-Efficient and 1.4x Operation-Speed Via-Switch FPGA with Rapid and Low-Cost ASIC Migration by Via-Switch Copy

講演者
Bai, X. and Banno, N. and Miyamura, M. and Nebashi, R. and Okamoto, K. and Numata, H. and Iguchi, N. and Hashimoto, M. and Sugibayashi, T. and Sakamoto, T. and Tada, M.
会議名
会議名Digest of Technical Papers - Symposium on VLSI Technology 主催者Digest of Technical Papers - Symposium on VLSI Technology 開催年月日2020 - 2020
主催
Digest of Technical Papers - Symposium on VLSI Technology
記述原語
英語