Keio University

Published papers

Ishikuro, Hiroki

121-140 items (total 143)

Experimental Evidence for Quantum Mechanical Narrow Channel Effect in Ultra-Narrow MOSFETs

Author
H. Majima, H. Ishikuro, and T. Hiramoto
Publication Title
Magazine name IEEE Electron Devices Letters Volume 21(Issue 8) Start Page 396 - 398 (Publication Date)2000/08)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Impact of the Device Scaling on the Low-Frequency Noise in n-MOSFETs

Author
H. M. Bu, Y. Shi, X. L. Yuan, Y. D. Zheng, S. H. Gu, H. Majima, H. Ishikuro, and T. Hiramoto
Publication Title
Magazine name Applied Physics A Volume A71(Issue 2) Start Page 133 - 136 (Publication Date)2000/06)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Random telegraph signals and low-frequency noise in n-metal-oxide-semiconductor field-effect transistors with ultranarrow channels

Author
H. M. Bu, Y. Shi, X. L. Yuan, J. Wu, S. L. Gu, and Y. D. Zheng, H. Majima, H. Ishikuro, and T. Hiramoto
Publication Title
Magazine name Applied Physics Letters Volume 76(Issue 22) Start Page 3259 - 3261 (Publication Date)2000/05)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Control of Coulomb blockade oscillations in silicon single electron transistor using silicon nano-crystal floating gates

Author
Nobuyoshi Takahashi, Hiroki Ishikuro, and Toshiro Hiramoto
Publication Title
Magazine name Applied Physics Letters Volume 76(Issue 2) Start Page 209 - 211 (Publication Date)2000/01)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Quantum Energy and Charging Energy in Point Contact MOSFETs acting as Single Electron Transistors

Author
Toshiro Hiramoto and Hiroki Ishikuro
Publication Title
Magazine name Superlattices and Microstructures Volume 24(Issue 1-2) Start Page 263 - 267 (Publication Date)1999)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Characteristic Distributions of Narrow Channel Metal-Oxide-Semiconductor Field-Effect-Transistor Memories with Silicon Nanocrystal Floating Gates

Author
Eiji Nagata, Nobuyoshi Takahashi, Yuri Yasuda, Takashi Inukai, Hiroki Ishikuro, and Toshiro Hiramoto
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 38(Issue 12B) Start Page 7230 - 7232 (Publication Date)1999/12)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Highly Integrated Single Electron Devices and Giga-bit Lithography

Author
Toshiro Hiramoto, H. Ishikuro, and H. Majima
Publication Title
Magazine name Journal of Photopolymer Science and Technology Volume 12(Issue 3) Start Page 417 - 422 (Publication Date)1999/06)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Coulomb Blockade in VLSI-Compatible Multiple-Dot and Single-Dot MOSFETs

Author
Toshiro Hiramoto and Hiroki Ishikuro
Publication Title
Magazine name International Journal of Electronics Volume 86(Issue 5) Start Page 591 - 603 (Publication Date)1999/05)
Authorship Category
Single Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals

Author
Yi Shi, Kenichi Saito, Hiroki Ishikuro, and Toshiro Hiramoto
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 38(Issue 4B) Start Page 2453 - 2456 (Publication Date)1999/04)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs

Author
Tran Ngoc Duyet, Hiroki Ishikuro, Yi Shi, Takuya Saraya, Makoto Takamiya, and Toshiro Hiramoto
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 38(Issue 4B) Start Page 2496 - 2500 (Publication Date)1999/04)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

On the origin of tunneling barriers in silicon single electron and single hole transistors

Author
H. Ishikuro and T. Hiramoto
Publication Title
Magazine name Applied Physics Letters Volume 74(Issue 8) Start Page 1126 - 1128 (Publication Date)1999/02)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based Metal-Oxide-Semiconductor Diodes

Author
Yi Shi, Kenichi Saito, Hiroki Ishikuro, and Toshiro Hiramoto
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 38(Issue 1B) Start Page 425 - 428 (Publication Date)1999/01)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Fabrication of Nano-Scale Point Contact Metal-Oxide-Semiconductor Field-Effect-Transistors Using Micrometer-Scale Design Rule

Author
Hiroki Ishikuro and Toshiro Hiramoto
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 38(Issue 1B) Start Page 396-398 (Publication Date)1999/01)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals

Author
Y. Shi, K. Saito, H. Ishikuro, and T. Hiramoto
Publication Title
Magazine name Journal of Applied Physics Volume 84(Issue 4) Start Page 2358-2360 (Publication Date)1998/08)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Hopping Transport in Multiple-Dot Silicon Single Electron MOSFET, Solid State Electronics

Author
H. Ishikuro and T. Hiramoto
Publication Title
Magazine name Solid State Electronics Volume 42(Issue 7-8) Start Page 1425 - 1428 (Publication Date)1998/07)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Suppression of Geometric Component of Charge Pumping Current in Thin Film SOI MOSFET

Author
N. Duyet, H. Ishikuro, M. Takamiya, T. Saraya, and T. Hiramoto
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 37(Issue 7B) Start Page L855 - L858 (Publication Date)1998/07)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Fabrication of Gate-All Around MOSFET by Silicon Anisotropic Etching Technique

Author
T. Mukaiyama, K. Saito, H. Ishikuro, M. Takamiya, T. Saraya, and T. Hiramoto
Publication Title
Magazine name Solid State Electronics Volume 42(Issue 7-8) Start Page 1623 - 1626 (Publication Date)1998/06)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Quantum mechanical effects in the silicon quantum dot in a single-electron-transistor

Author
Hiroki Ishikuro and Toshiro Hiramoto
Publication Title
Magazine name Applied Physics Letters Volume 71(Issue 25) Start Page 3691 - 3693 (Publication Date)1997/12)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel MOSFET

Author
T. Hiramoto, H. Ishikuro, T. Fujii, G. Hashiguchi, and T. Ikoma
Publication Title
Magazine name Japanese Journal of Applied Physics Volume 36(Issue 6B) Start Page 4139 - 4142 (Publication Date)1997/06)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With

Characterization of Precisely Width-Controlled Si Quantum Wires Fabricated on SOI Substrates

Author
T. Hiramoto, H. Ishikuro, T. Fujii, T. Saraya, G. Hashiguchi, and T. Ikoma
Publication Title
Magazine name Physics B Start Page 95 - 97 (Publication Date)1996)
Authorship Category
Joint Work
Publication Category
Research paper (scientific journal)
Peer-review Status
With